To provide a test bench capable of saving the works of test scenario and improving efficiency, in creating the test bench.

In a test scenario 102 for verifying the function for transferring data in a plurality of external storage devices to a single continuous area on a main storage device, the continuous data is set collectively to a first data-holding buffer 106, the expectation value of the data written in a main storage device model 105 is generated in a second data-holding buffer 107, a CPU model 103 is controlled, the data set in the first data-holding buffer 106 is read out by an external storage device model 104, and input to a model 50 of a circuit to be verified, and the data are transmitted from the model 50 of the verified circuit to the main storage device model 105, to be compared with the expectation value held in the second data-holding buffer 107.

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