Title:
電気光学装置用基板及びその検査方法、並びに電気光学装置及び電子機器
Document Type and Number:
Japanese Patent JP4432829
Kind Code:
B2
Abstract:
A substrate for an electro-optical device includes amplifiers each has a first node and a second node, the first node connected to a signal line and being input with a first potential signal, the second node being input with a second potential signal, each amplifier outputting signals such that the potential of the first node is further decreased when the first potential signal is low, and the potential of the first node is further increased when the first potential signal is high. At least two signal lines correspond to at least one of the first and second nodes. A selection unit that selects one signal line. A connection unit connect the selected signal line to at least one of the first and second nodes.
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Inventors:
Tatsuya Ishii
Application Number:
JP2005134989A
Publication Date:
March 17, 2010
Filing Date:
May 06, 2005
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
G02F1/13; G01R31/00; G02F1/1368; G09F9/00; G09F9/30; G09G3/20; G09G3/36
Domestic Patent References:
| JP2004226551A | ||||
| JP11288598A | ||||
| JP2000173300A | ||||
| JP2004152399A | ||||
| JP11167373A | ||||
| JP2003208132A | ||||
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| JP2003114658A | ||||
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Attorney, Agent or Firm:
Masahiko Ueyanagi
Osamu Suzawa
Osamu Suzawa