Title:
半導体ホールセンサ
Document Type and Number:
Japanese Patent JP4490687
Kind Code:
B2
Abstract:
A semiconductor Hall sensor can reduce measuring error due to an unbalanced voltage by decreasing the unbalanced voltage, and improve resistance to electrostatic by suppressing maximum electric field in the sensor. A cross-shaped pattern of the semiconductor Hall sensor includes cutouts at its concave corners. Among the four concave corners of the cross-shaped pattern, consecutive two or four concave corners are provided with the cutouts. Besides, among the four concave corners of the cross-shaped patterns, the consecutive two or four concave corners have an acute angle at the intersection of the input terminal side pattern and output terminal side pattern. The semiconductor Hall sensor becomes insensitive to defects or unbalance of its pattern, thereby being able to reduce the unbalanced voltage as compared with a conventional cross-shaped pattern of the semiconductor Hall sensor.
Inventors:
Toshinori Takatsuka
Application Number:
JP2003516112A
Publication Date:
June 30, 2010
Filing Date:
July 25, 2002
Export Citation:
Assignee:
Asahi Kasei Electronics Co., Ltd.
International Classes:
H01L43/06; G01R33/07
Domestic Patent References:
| JPH02187083A | 1990-07-23 | |||
| JPS4856077A | 1973-08-07 | |||
| JPS55134992A | 1980-10-21 |
Attorney, Agent or Firm:
Yoshikazu Tani