Title:
散乱型近接場顕微鏡およびその測定方法
Document Type and Number:
Japanese Patent JP4498081
Kind Code:
B2
Inventors:
Satoshi Kawata
Yuka Saito
Norihiko Hayazawa
Yasushi Inoue
Makoto Iyoki
Yuka Saito
Norihiko Hayazawa
Yasushi Inoue
Makoto Iyoki
Application Number:
JP2004272875A
Publication Date:
July 07, 2010
Filing Date:
September 21, 2004
Export Citation:
Assignee:
SII Nanotechnology Co., Ltd.
RIKEN
RIKEN
International Classes:
G01Q60/18; G01B11/00; G01Q10/04; G01Q30/02
Domestic Patent References:
| JP2002236087U | ||||
| JP9178762A | ||||
| JP9054099A | ||||
| JP10267945A | ||||
| JP2001033464A | ||||
| JP2004101425A |
Foreign References:
| WO2004015455A1 |
Attorney, Agent or Firm:
Kentaro Kuhara
Noriaki Uchino
Nobuyuki Kimura
Noriaki Uchino
Nobuyuki Kimura