Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
光学的位置測定装置
Document Type and Number:
Japanese Patent JP4503799
Kind Code:
B2
Abstract:
The device has a measurement scale (1.2), a sensing unit (2) moving w.r.t. it in at least one measurement direction, a light source (2.1), optional transmission scale, a projection scale (2.4), a detection scale, an optional Vernier scale and several optoelectronic detector elements. Light from source is projected in a strip pattern onto detection scale using a projection scale so that shift-dependent output signals can be detected by the detector elements.

Inventors:
Wolfgang Holzapfuer
Walter Hoover
Application Number:
JP2000261121A
Publication Date:
July 14, 2010
Filing Date:
August 30, 2000
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
DR. JOHANNES HEIDENHAIN GESELLSCHAFT MIT BESCHRANKTER HAFTUNG
International Classes:
G01B11/00; G01D5/38
Domestic Patent References:
JP10501334A
JP8271218A
JP7506669A
Attorney, Agent or Firm:
Mitsufumi Esaki
Tsuneo Mihara
Okumura Yoshimichi
Blacksmith