Title:
電圧印加電流測定装置及び半導体試験装置
Document Type and Number:
Japanese Patent JP4511771
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a voltage-applied current measuring apparatus realizable by a cheaper circuit arrangement and a semiconductor tester using the same. SOLUTION: The current-measuring apparatus has a floating type current measuring unit 300, having a floating form insulated from a circuit ground GND. The unit 300 is mainly composed of a floating power source, a current detecting resistance, a gain-regulating resistance, an operational amplifier(OPAMP), an DC converter, a series output unit and a photocoupler. The floating power source intended to feed circuits used for the measuring unit 300 with DC powers is an insulated DC power source floating from the circuit ground and is composed of, e.g., light-emitting elements and solar cells.
Inventors:
Tadaaki Sato
Application Number:
JP2001243404A
Publication Date:
July 28, 2010
Filing Date:
August 10, 2001
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R19/165; G01R31/28; G01R31/26
Domestic Patent References:
| JP5142267A | ||||
| JP10111322A | ||||
| JP2285968A | ||||
| JP5119110A | ||||
| JP62178379U |
Attorney, Agent or Firm:
Akihiro Ryuka