Title:
全反射蛍光X線分析装置およびその装置に用いるプログラム
Document Type and Number:
Japanese Patent JP4514781
Kind Code:
B2
Inventors:
Hiroyuki Kawakami
Yasuhiro Shimizu
Fukuda Tomoyuki
Yasuhiro Shimizu
Fukuda Tomoyuki
Application Number:
JP2007267671A
Publication Date:
July 28, 2010
Filing Date:
October 15, 2007
Export Citation:
Assignee:
Rigaku Corporation
International Classes:
G01N23/223
Domestic Patent References:
| JP6102214A | ||||
| JP5249055A | ||||
| JP2001343339A |
Foreign References:
| WO1995020759A1 |
Attorney, Agent or Firm:
Shuji Sugimoto
Masashi Noda
Kenro Tsutsumi
Masashi Noda
Kenro Tsutsumi