Title:
センサの性能確認装置および方法
Document Type and Number:
Japanese Patent JP4528335
Kind Code:
B2
Abstract:
An apparatus and method is disclosed for detecting, identifying, and classifying faults occurring in sensors measuring a process. If faults are identified in one or more sensors, the apparatus and method provide replacement values for the faulty sensors so that any process controllers and process monitoring systems that use these sensors can remain in operation during the fault period. The identification of faulty sensors is achieved through the use of a set of structured residual transforms that are uniquely designed to be insensitive to specific subsets of sensors, while being maximally sensitive to sensors not in the subset. Identified faults are classified into one of the types Complete Failure, Bias, Drift, Precision Loss, or Unknown.
Inventors:
Quinn S Joe
Guyver John
Guyver John
Application Number:
JP2008033036A
Publication Date:
August 18, 2010
Filing Date:
February 14, 2008
Export Citation:
Assignee:
ASPEN TECHNOLOGY, INC.
International Classes:
G01D21/00; G01M99/00; G05B23/02; G05B9/02
Domestic Patent References:
| JP8241121A | ||||
| JP8320726A | ||||
| JP10094943A | ||||
| JP6208568A |
Attorney, Agent or Firm:
Shuji Sugimoto
Masashi Noda
Kenro Tsutsumi
Masashi Noda
Kenro Tsutsumi