Title:
システム顕微鏡
Document Type and Number:
Japanese Patent JP4558366
Kind Code:
B2
Abstract:
A system microscope includes a microscope body (1), a stage (2) which is provided on an upper portion of the microscope body (1) and on which a sample (3) is placed, a lower objective lens (5) provided below the stage (2), an upper objective lens (29) provided above the stage (2), a portal support member (22, 24, 25) which is provided on the upper portion of the microscope body (1) so as to straddle the stage (2), a lower illumination device (7) which is provided for the microscope body (1) and illuminates the sample (3) from below, an upper illumination device (30) which is provided on the portal support member and illuminates the sample (3) from above, a lower eyepiece lens (20) which is provided for the microscope body (1) and acquires an observation image of the sample (3) from the lower objective lens (5), and an upper eyepiece lens (41) which is provided on the portal support member and acquires an observation image of the sample (3) from the upper objective lens (29).
Inventors:
Aono
Nakata Tatsuo
Atsuhiro Tsuchiya
Nakata Tatsuo
Atsuhiro Tsuchiya
Application Number:
JP2004098230A
Publication Date:
October 06, 2010
Filing Date:
March 30, 2004
Export Citation:
Assignee:
Olympus Endo Technology America Inc.
International Classes:
G02B21/24; G02B21/00; G02B21/06; G02B21/18; G03F7/20
Domestic Patent References:
| JP9105867A | ||||
| JP2002169100A | ||||
| JP2002055282A | ||||
| JP2001013387A | ||||
| JP3035980U |
Foreign References:
| WO2001071406A1 |
Attorney, Agent or Firm:
Satoshi Kono
Sadao Muramatsu
Tetsuya Kazama
Sadao Muramatsu
Tetsuya Kazama