Title:
測角システム
Document Type and Number:
Japanese Patent JP4580054
Kind Code:
B2
Abstract:
An angle measuring system for high-precision determination of the angular position of an object, the system including a stationary component unit, a rotationally symmetrical measurement graduation that is connected to an object that rotates about an axis of rotation (R) and a plurality of scanner units that are disposed in a defined three-dimensional orientation in the stationary component unit and serve to scan the measurement graduation at a plurality of different measurement graduation sites and generate angular-position-dependent fractional scanning signals. The system includes a correction system that receives the fractional scanning signals of the scanner units and generates angle-dependent output signals that are freed of errors that result from a possibly occurring nonagreement of the axis of rotation (R) of the object with an axis of symmetry of the measurement graduation.
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Inventors:
Kurt Huaychinger
Application Number:
JP2000039433A
Publication Date:
November 10, 2010
Filing Date:
February 17, 2000
Export Citation:
Assignee:
DR. JOHANNES HEIDENHAIN GESELLSCHAFT MIT BESCHRANKTER HAFTUNG
International Classes:
G01B21/22; G01D5/244; G01D5/245; G01D5/347
Domestic Patent References:
| JP6258099A | ||||
| JP2027506U | ||||
| JP55067608A | ||||
| JP6056722U |
Foreign References:
| EP0325924B1 | ||||
| WO1998001724A1 |
Attorney, Agent or Firm:
Mitsufumi Esaki
Tsuneo Mihara
Blacksmith
Tsuneo Mihara
Blacksmith