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Title:
電気的接続部の非接触検査方法及び非接触検査装置
Document Type and Number:
Japanese Patent JP4586124
Kind Code:
B2
Abstract:

To solve the problem wherein connection between liquid crystal cells and driver ICs in a liquid crystal display apparatus cannot be inspected without energization to the apparatus.

A large number of capacitive circuit elements are connected in parallel and aligned on an insulating substrate 12, and conductive patterns 18 are connected to one ends of the circuit elements in a circuit board 10. Leads 28a of an electronic component 24 are electrically connected to the conductive patterns 18 of the circuit board 10 via a conductive adhesive 22 in electrical connection parts. A high-frequency field generating means and a pickup coil 34 for inspection are brought close to the electrical connection parts. On the basis of changes in a high-frequency current passing through the pickup coil 34, the quality of connection of the electrical connection parts is determined.

COPYRIGHT: (C)2005,JPO&NCIPI


Inventors:
Shigeru Kobayashi
Takehiko Wada
Kojima Eisaku
Application Number:
JP2003194966A
Publication Date:
November 24, 2010
Filing Date:
July 10, 2003
Export Citation:
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Assignee:
Chi Mei Optoelectronics Corporation
International Classes:
G01R31/02
Domestic Patent References:
JP62119674U
JP62011174A
JP62187258A
JP64091056A
JP1199132A
JP8036191A
JP5118330A
JP5322855A
JP6155583A
JP2001296326A
Attorney, Agent or Firm:
Takayoshi Kusumoto
Ken Masuda