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Patent Searching and Data


Title:
磁場測定プローブ
Document Type and Number:
Japanese Patent JP4607883
Kind Code:
B2
Abstract:
A magnetic-field-measuring probe includes at least one magnetoresistive or magnetoinductive sensor which is sensitive to the magnetic field along a privileged measurement axis. The probe includes: at least two magnetoresistive or magnetoinductive sensors ( 14, 16 ) which are rigidly connected to one another in a position such that the privileged measurement axes thereof are parallel and offset in relation to one another in a direction that is transverse to the privileged measurement axes; and output terminals specific to each magnetoresistive or magnetoinductive sensor, in order to supply a signal that is representative of the magnetic field measured by each sensor along the privileged measurement axis thereof.

Inventors:
Roman
Klepel, Olivier
Board one, ferri
Philippe Perdu
Application Number:
JP2006530430A
Publication Date:
January 05, 2011
Filing Date:
October 08, 2004
Export Citation:
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Assignee:
Center Nacional Degree Spasial
International Classes:
G01R33/02; G01R31/302; G01R33/09; H01L21/66
Domestic Patent References:
JP9166653A
JP5232202A
JP3025375A
JP2002286740A
Foreign References:
US6124712
Attorney, Agent or Firm:
Atsushi Aoki
Jun Tsuruta
Tetsuro Shimada
Kurachi Yasuyuki
Shimichi Akihisa