Title:
書換え可能な不揮発性メモリの検査方法
Document Type and Number:
Japanese Patent JP4617603
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a method for inspecting nonvolatile memories 1 capable of reducing the probability of mixture of the nonvolatile memories 1 to be actually used on the market and become defectives by adding an inspection process in which a manufacturing side and a receiving side are combined. SOLUTION: In addition to a normally performed high-temperature burn-in inspection (process S20), the nonvolatile memories 1 regarded as conforming items in the process S20 are transferred to a purchasing (purchasers') side which purchases the nonvolatile memories 1 from the manufacturing (manufacturers') side as with data indicating the state of the presence of electric charge while provided with a transfer period (C in Fig. 1). An inspection for verifying whether all the data of data storage areas 2 maintains the state of the presence of electric charge is added on the purchasing (purchasers') side (process S60). By this, the transfer period C is utilized as a normal-temperature storage period as normal-temperature burn-in, and it is possible to reduce the probability of defective mixture of the nonvolatile memories 1 in comparison with the case of only the high-temperature burn-in inspection.
Inventors:
Ozawa
Application Number:
JP2001155829A
Publication Date:
January 26, 2011
Filing Date:
May 24, 2001
Export Citation:
Assignee:
株式会社デンソー
International Classes:
G01R31/30; G01R31/28
Domestic Patent References:
| JP11354601A | ||||
| JP2000231797A | ||||
| JP10199293A | ||||
| JP10208498A | ||||
| JP63117400A |
Attorney, Agent or Firm:
Taihei Nonobe
Kazuyuki Yahagi
Kazuyuki Yahagi