Title:
光学ホログラム干渉法による、物体中の残留応力のリアルタイム非破壊測定を行うための方法および装置
Document Type and Number:
Japanese Patent JP4623907
Kind Code:
B2
Inventors:
Forster, Johann Petter
Forster, Irina Evgenyevna
Lovanov, Leonid Mikarovich
Piftlak, Hujacheslav Antonomovic
Kuchsinski, Nikolai Georgievic
Andrussychenko, Sergey Gavrilovich
Kushnirk, Hradimill Petrovich Pee 2.
Loginov, Hradimy Petrovich Ur.
Sable, Peter Dmitrievich P 2.
Pavlov, Valery Aleandrovich
Forster, Irina Evgenyevna
Lovanov, Leonid Mikarovich
Piftlak, Hujacheslav Antonomovic
Kuchsinski, Nikolai Georgievic
Andrussychenko, Sergey Gavrilovich
Kushnirk, Hradimill Petrovich Pee 2.
Loginov, Hradimy Petrovich Ur.
Sable, Peter Dmitrievich P 2.
Pavlov, Valery Aleandrovich
Application Number:
JP2001538126A
Publication Date:
February 02, 2011
Filing Date:
October 19, 2000
Export Citation:
Assignee:
Holotec Actiesl Scab
International Classes:
G01B11/16; G01L1/00; G01B9/021; G01L1/24; G01L5/00
Domestic Patent References:
| JP4223208A | ||||
| JP4186106A | ||||
| JP61501046A |
Foreign References:
| WO1995010023A1 |
Attorney, Agent or Firm:
Kenho Ikeda