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Title:
パルス光励起表面正孔量測定による光触媒性能評価法
Document Type and Number:
Japanese Patent JP4630995
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To instantaneously estimate a catalytic performance under an environment where a substance is planned to be used, and moreover, clarify a deterioration reason of a photocatalytic reaction having a complicate mechanism by using a wavelength variable pulse light as an incident light in a method for evaluating the photocatalytic performance. SOLUTION: According to the method for evaluating the photocatalytic performance by measuring a quantity of pulse light excited surface holes, a transparent insulating sheet is coated to a surface of a photocatalyst thin film, which are held between two transparent electrodes. The number of holes excited to the surface by illuminating a pulse laser is instantaneously observed by a digital oscilloscope. A dependency on an incident wavelength of the photocatalytic performance of the substance can also be estimated.

Inventors:
Yasushi Sumita
Haruya Yamamoto
Application Number:
JP2000213772A
Publication Date:
February 09, 2011
Filing Date:
July 14, 2000
Export Citation:
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Assignee:
Japan Atomic Energy Agency
International Classes:
G01N23/20; B01J35/02; G01N27/00; G01N27/60
Domestic Patent References:
JP11258206A
JP11083833A
JP2001183321A
Other References:
大谷文章,光触媒活性は何によって決まるのか-再結合の評価と制御,第84回触媒討論会 討論会A予稿集,1999年 9月 6日,p.97
Attorney, Agent or Firm:
Kazuo Shamoto
Shinjiro Ono
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Shurin Sakurai
Fujihiro Kanda
Hideo Tanaka
Shinya Hosokawa
Norihiro Fukasawa
Koji Hirayama



 
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