Title:
パルス光励起表面正孔量測定による光触媒性能評価法
Document Type and Number:
Japanese Patent JP4630995
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To instantaneously estimate a catalytic performance under an environment where a substance is planned to be used, and moreover, clarify a deterioration reason of a photocatalytic reaction having a complicate mechanism by using a wavelength variable pulse light as an incident light in a method for evaluating the photocatalytic performance. SOLUTION: According to the method for evaluating the photocatalytic performance by measuring a quantity of pulse light excited surface holes, a transparent insulating sheet is coated to a surface of a photocatalyst thin film, which are held between two transparent electrodes. The number of holes excited to the surface by illuminating a pulse laser is instantaneously observed by a digital oscilloscope. A dependency on an incident wavelength of the photocatalytic performance of the substance can also be estimated.
Inventors:
Yasushi Sumita
Haruya Yamamoto
Haruya Yamamoto
Application Number:
JP2000213772A
Publication Date:
February 09, 2011
Filing Date:
July 14, 2000
Export Citation:
Assignee:
Japan Atomic Energy Agency
International Classes:
G01N23/20; B01J35/02; G01N27/00; G01N27/60
Domestic Patent References:
JP11258206A | ||||
JP11083833A | ||||
JP2001183321A |
Other References:
大谷文章,光触媒活性は何によって決まるのか-再結合の評価と制御,第84回触媒討論会 討論会A予稿集,1999年 9月 6日,p.97
Attorney, Agent or Firm:
Kazuo Shamoto
Shinjiro Ono
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Shurin Sakurai
Fujihiro Kanda
Hideo Tanaka
Shinya Hosokawa
Norihiro Fukasawa
Koji Hirayama
Shinjiro Ono
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Shurin Sakurai
Fujihiro Kanda
Hideo Tanaka
Shinya Hosokawa
Norihiro Fukasawa
Koji Hirayama