Title:
ショートサンプルとロングサンプルとを検出するためのシステムおよび方法
Document Type and Number:
Japanese Patent JP4633465
Kind Code:
B2
Abstract:
Methods and systems are provided for detecting the accidental use of short and long samples in the clinical analysis of a sample, specimen, or assay. The systems can include a clinical analyzer for determining one or more values for one or more measurable characteristics of a sample. These values are used in combination with reference data stored in a data module to generate a probability that the sample tested is a short sample, a long sample, or an acceptable sample. This probability and/or the status of the sample as a short sample, a long sample, or an acceptable sample are output to a user.
Inventors:
Ostrich, Vladimir, E.
Aaron, Kenneth
Breel, Dennis, M.
Aaron, Kenneth
Breel, Dennis, M.
Application Number:
JP2004545458A
Publication Date:
February 16, 2011
Filing Date:
October 17, 2003
Export Citation:
Assignee:
Abaxis, Incorporated
International Classes:
G01N33/48; G01N33/52; G01N35/00
Domestic Patent References:
| JP1129166A | ||||
| JP10038898A | ||||
| JP2001221804A |
Attorney, Agent or Firm:
Yusuke Hiraki
Sekiya Mitsuo
Toshiaki Watanabe
Kenichi Imamura
Sekiya Mitsuo
Toshiaki Watanabe
Kenichi Imamura