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Title:
自動顕微鏡及びこれを備える分析装置
Document Type and Number:
Japanese Patent JP4708143
Kind Code:
B2
Abstract:
A microscope which comprises: an optical system for magnifying a sample; a focus adjuster for adjusting a focus of the optical system on the sample; an optical detector for detecting light through the optical system; a position estimator for estimating a position of the focus of the optical system, which stays with respect to the sample, based on the light detected by the optical detector while the optical system is vibrating with respect to the sample; and a controller for controlling the focus adjuster based on the position of the focus estimated by the position estimator, is disclosed. An auto focusing method for a microscope is also disclosed.

Inventors:
Touma Ryuichi
Application Number:
JP2005287982A
Publication Date:
June 22, 2011
Filing Date:
September 30, 2005
Export Citation:
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Assignee:
Sysmex Corporation
International Classes:
G02B7/28; G02B21/00
Domestic Patent References:
JP61210310A
JP5212056A
JP2000009989A
JP3091377A
JP64042616A
JP2002169101A
Attorney, Agent or Firm:
Patent Business Corporation Suncrest International Patent Office