Title:
光学式インプロセス制御による比濁分析検出ユニット
Document Type and Number:
Japanese Patent JP4763868
Kind Code:
B2
Abstract:
A method (I) for carrying out a light scatter measurement, where the optical rays are arranged so that the intensity of the rays and the transmitted part of the light are measured separately, is new.
Inventors:
Paul Mellar
Application Number:
JP30516399A
Publication Date:
August 31, 2011
Filing Date:
October 27, 1999
Export Citation:
Assignee:
Siemens, Healthcare, Diagnostics, Products, Game Behr
International Classes:
G01N21/49; G01N21/47
Domestic Patent References:
| JP7270314A | ||||
| JP7294429A | ||||
| JP59060323A | ||||
| JP58096234A | ||||
| JP56094245A | ||||
| JP1162130A | ||||
| JP61286758A | ||||
| JP62006142A | ||||
| JP40009471B1 |
Foreign References:
| US4343552 | ||||
| US5294796 | ||||
| US3310680 |
Attorney, Agent or Firm:
Junji Yuda
Shoji Miwa
Noriyuki Takebayashi
Chika Takagi
Kosuke Nishimura
Shoji Miwa
Noriyuki Takebayashi
Chika Takagi
Kosuke Nishimura