Title:
ラージフォーマットサンプルの複屈折測定
Document Type and Number:
Japanese Patent JP4778314
Kind Code:
B2
Abstract:
The disclosure is directed to systems and methods for precisely measuring birefringence properties of large-format samples of optical elements. A gantry-like configuration is employed for precise movement of birefringence measurement system components relative to the sample. There is also provided an effective large-format sample holder that adequately supports the sample to prevent induced birefringence therein while still presenting a large area of the sample to the unhindered passage of light.
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Inventors:
Kaplan, Andrew, Dee
Mansfield, James, Sea
Mark, Douglas, Sea
Mansfield, James, Sea
Mark, Douglas, Sea
Application Number:
JP2005501390A
Publication Date:
September 21, 2011
Filing Date:
October 08, 2003
Export Citation:
Assignee:
Hines Instruments, Inc.
International Classes:
G01M11/00; G01M11/02; G01N21/23; G01N21/95
Domestic Patent References:
| JPH0961319A | 1997-03-07 | |||
| JP2001108629A | 2001-04-20 |
Attorney, Agent or Firm:
Nobuyuki Matsunaga