Title:
周波数成分測定装置
Document Type and Number:
Japanese Patent JP4782502
Kind Code:
B2
Abstract:
A frequency component measuring device formed in a simple structure and enabling a reduction in measurement time and an increase in measurement accuracy. The frequency component measuring device comprises mixers 10, 20 and local oscillators 12, 22, and the like, as a plurality of frequency changing units changing the frequencies of signals to be measured input thereto in common, and a signal processing section 40 as a signal processing unit for extracting frequency components and removing images based on signals provided after the frequencies are changed by the plurality of frequency changing units.
Inventors:
Hiroyuki Kurita
Application Number:
JP2005215453A
Publication Date:
September 28, 2011
Filing Date:
July 26, 2005
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R23/173
Domestic Patent References:
| JP58068677A |
Foreign References:
| WO2002029426A1 |
Attorney, Agent or Firm:
Masahiko Amagai