Title:
物理量計測装置および物理量計測方法
Document Type and Number:
Japanese Patent JP4787359
Kind Code:
B2
Abstract:
Even if a measurement data group is not a measurement data group that is obtained in a space where the magnitude of a vector physical quantity to be measured is uniform, an offset with high reliability is estimated. The reliability of the estimated offset is further improved. A vector physical quantity comprised of a plurality of components is repeatedly detected and vector physical quantity data group is obtained, and a difference vector group is calculated from the obtained vector physical quantity data group. A reference point included in the vector physical quantity data group is estimated based on a predetermined evaluation formula using the calculated difference vector group. Whether the calculated difference vector group is suitable for the estimation of the reference point is determined. Only a predetermined difference vector group is output for the estimation of the reference point based on the determination result. Moreover, the degree of reliability of the estimated reference point contains the difference vector group, and only a predetermined reference point is output as an offset based on the determination result.
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Inventors:
Yamashita Masaya
Toru Kitamura
Toru Kitamura
Application Number:
JP2009516307A
Publication Date:
October 05, 2011
Filing Date:
May 23, 2008
Export Citation:
Assignee:
Asahi Kasei Electronics Co., Ltd.
International Classes:
G01C17/38; G01P15/18; G01P21/00
Domestic Patent References:
| JP2006275524A | 2006-10-12 | |||
| JP2006226810A | 2006-08-31 | |||
| JP2005207799A | 2005-08-04 | |||
| JP2005195376A | 2005-07-21 |
Attorney, Agent or Firm:
Yoshikazu Tani