校正機能を有する赤外顕微鏡及び赤外顕微鏡の校正方法

Title:

校正機能を有する赤外顕微鏡及び赤外顕微鏡の校正方法

Document Type and Number:

Japanese Patent JP4800749

Kind Code:

B2

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Inventors:

Akihiro Kitahara
Plow pattern Takuma

Application Number:

JP2005324948A

Publication Date:

October 26, 2011

Filing Date:

November 09, 2005

Export Citation:

Assignee:

Olympus Endo Technology America Inc.

International Classes:

G01B11/00; G02B21/06; G02B21/34

Domestic Patent References:

Attorney, Agent or Firm:

Satoshi Kono
Makoto Nakamura
Kurata Masatoshi
Takashi Mine
Yoshihiro Fukuhara
Sadao Muramatsu
Ryo Hashimoto

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