Title:
多分析対象物測定のためのキット及び方法
Document Type and Number:
Japanese Patent JP4812223
Kind Code:
B2
Abstract:
The invention is related to different embodiments of a kit for the simultaneous qualitative and/or quantitative determination of a multitude of analytes comprising a sensor platform comprising an optical thin-film waveguide with a layer (a) transparent at least at an excitation wavelength on a layer (b) with lower refractive index than layer (a), also transparent at least at said excitation wavelength, and at least one grating structure (c) modulated in said layer (a), for the incoupling of said excitation light into layer (a), at least one array of biological or biochemical or synthetic recognition elements immobilized in discrete measurement areas (d) directly or by means of an adhesion-promoting layer on layer (a), for specific recognition and/or binding of said analytes and/or for specific interaction with said analytes, means for laterally resolved referencing of the excitation light intensity available in the measurement areas, and optionally means for the calibration of one or more luminescences generated in the near-field of layer (a) as a consequence of the binding of one or more analytes or of the specific interaction with one or more analytes, wherein a liquid sample to be analyzed for said analytes is brought into contact with said measurement areas on said sensor platform either directly or after mixture with further reagents. The invention is also related to analytical systems based on a kit according to the invention and to methods for the determination of one or more analytes, based on said kit, and to use thereof.
Inventors:
Paul, Michael
Chic, Egginhard
Abel, Andreas P.
Dufenek, Gerd El
Marath, Eilat
Cresbach, Gerhard Em
Surman-Murder, Eveline
Bopp, Martin Ah
Chic, Egginhard
Abel, Andreas P.
Dufenek, Gerd El
Marath, Eilat
Cresbach, Gerhard Em
Surman-Murder, Eveline
Bopp, Martin Ah
Application Number:
JP2002501026A
Publication Date:
November 09, 2011
Filing Date:
May 25, 2001
Export Citation:
Assignee:
Bayer Technology Services GmbH
International Classes:
G01N33/543; B01L3/00; G01N21/25; G01N21/64; G01N21/76; G01N33/15; G01N33/53; G01N33/569; G01N37/00
Domestic Patent References:
| JPH11505610A | 1999-05-21 | |||
| JPH05209886A | 1993-08-20 |
Attorney, Agent or Firm:
Hajime Tsukuni
Yasuo Yanagibashi
Yasuo Yanagibashi