Title:
デバイステスタ
Document Type and Number:
Japanese Patent JP4826788
Kind Code:
B2
Abstract:
To facilitate obtaining of the overall trend of shmoo data of a plurality of DUTs, and to calculate the correlation of the plurality of DUTs using various logical expressions without acquiring shmoo again.
This device tester 100 includes a shmoo acquisition section 310 for acquiring shmoo data of the plurality of DUTs 140, a data storage section 312 for storing a plurality of acquired shmoo data in a tester memory, a data selection section 314 for making a user select one or two or more shmoo data from the plurality of shmoo data with a shmoo tool, and a preview function section 318 for arranging and displaying the one or two or more selected shmoo data on a display section 212 at once.
COPYRIGHT: (C)2008,JPO&INPIT
Inventors:
Yuka Kashima
Application Number:
JP2006330259A
Publication Date:
November 30, 2011
Filing Date:
December 07, 2006
Export Citation:
Assignee:
Yokogawa Electric Corporation
International Classes:
G01R31/28
Domestic Patent References:
| JP2003279623A | ||||
| JP11316246A | ||||
| JP2002170396A | ||||
| JP8335610A | ||||
| JP59188574A |