Title:
点検支援装置、点検支援システム、点検支援方法、及び点検支援プログラム
Document Type and Number:
Japanese Patent JP5037732
Kind Code:
B2
Abstract:
An inspection assistance device (100) is provided with a camera (20) which picks up an image of each measurement device; a display device (34) which displays assistance information assisting with the inspection work by the person inspecting; a storage unit (31) which stores inspection information including identification information for each measurement device that should be measured; and a processing unit (32) which identifies the respective identification information and a measurement value for each measurement device on the basis of the image information for each measurement device picked up by the camera (20), stores measurement values and identification information in the storage device (31) while associating each measurement value with the respective identification information, and furthermore, when it is determined that among the measurement devices there is an unmeasured measurement device, which is not yet stored in the storage device (31), causes the display unit (34) to display the identification information of the unmeasured measurement device as assistance information.
Inventors:
Nakao Noboru
Minoru Harada
Minoru Harada
Application Number:
JP2011554321A
Publication Date:
October 03, 2012
Filing Date:
October 04, 2011
Export Citation:
Assignee:
Nippon Steel Corporation
International Classes:
G05B23/02
Domestic Patent References:
| JPH0869595A | 1996-03-12 | |||
| JPH0877484A | 1996-03-22 | |||
| JPS61231694A | 1986-10-15 | |||
| JP2002245188A | 2002-08-30 | |||
| JP2006302016A | 2006-11-02 | |||
| JP2003173196A | 2003-06-20 |
Attorney, Agent or Firm:
Masatake Shiga
Tadashi Takahashi
Sumio Tanai
Hiroshi Masui
Tomoo Katsumata
Tadashi Takahashi
Sumio Tanai
Hiroshi Masui
Tomoo Katsumata