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Title:
コンポーネント化されていない印刷回路基板の検査のためのフィンガーテスター及びフィンガーテスターでコンポーネント化されていない印刷回路基板を検査する方法
Document Type and Number:
Japanese Patent JP5080498
Kind Code:
B2
Abstract:
A finger tester for testing non-componented printed circuit boards uses two or more test fingers, each having a test probe. A detection device is provided above each test probe for optical detection of the position above the circuit board of at least one contact tip of the test probe. The detection devices of the test fingers are each arranged in different vertically spaced planes, so that areas of the detection devices located above the test fingers are positioned above one another, aligned vertically to prevent contact during testing.

Inventors:
Romanov, Victor
Application Number:
JP2008551658A
Publication Date:
November 21, 2012
Filing Date:
November 15, 2006
Export Citation:
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Assignee:
Artege Lutheran und Meltzer Gaem Behr
International Classes:
G01R31/02
Domestic Patent References:
JP62176281A
JP4340484A
JP8233862A
JP10332792A
JP2005532535A
JP2006194685A
JP63061136U
JP6033142U
Attorney, Agent or Firm:
Global IP Tokyo Patent Business Corporation



 
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