Title:
インパルスイミュニティ評価装置
Document Type and Number:
Japanese Patent JP5177902
Kind Code:
B2
Abstract:
The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform. A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time.
Inventors:
Tsukagoshi Tsuneo
Takeshi Watanabe
Nakaya Toshiyuki
Matsui
Takeshi Watanabe
Nakaya Toshiyuki
Matsui
Application Number:
JP2009502645A
Publication Date:
April 10, 2013
Filing Date:
March 06, 2008
Export Citation:
Assignee:
NEC
Renesas Electronics Corporation
Hanwa Electronics Co., Ltd.
Renesas Electronics Corporation
Hanwa Electronics Co., Ltd.
International Classes:
G01R31/30
Domestic Patent References:
| JPH02113176U | 1990-09-11 | |||
| JP2004085477A | 2004-03-18 | |||
| JPS58100759A | 1983-06-15 | |||
| JP2004309153A | 2004-11-04 | |||
| JPS62182674A | 1987-08-11 | |||
| JP2006058118A | 2006-03-02 | |||
| JP2000206177A | 2000-07-28 | |||
| JPH02113176U | 1990-09-11 |
Attorney, Agent or Firm:
Kenho Ikeda
Shuichi Fukuda
Takashi Sasaki
Shuichi Fukuda
Takashi Sasaki