Title:
顕微鏡システム及び観察方法
Document Type and Number:
Japanese Patent JP5231610
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a microscope system capable of surely measuring the movement of a sample in a long-term observation analysis.SOLUTION: The microscope system 100 includes: a stage 101 which is loaded with an observation sample 102; and an objective lens 109 arranged opposed to the observation sample 102 placed on the stage 101. The position of the stage 101 can be electrically controlled in X-Y-Z directions, and the microscope system 100 includes: a stage X-Y controller 115 for controlling the position of the stage 101 in the X-Y directions; and a stage Z drive control part 116 for controlling the position of the stage 101 in the Z direction. Additionally, the microscope system 100 includes a well-known active-type auto-focus unit 118 for microscopes. At least one of the stage and the objective lens is moved with a focusing drive part by a predetermined constant amount after auto-focus is performed on either of a slide glass or a cover glass with an auto-focus part.
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Inventors:
Yoneyama Taka
Atsuhiro Tsuchiya
Atsuhiro Tsuchiya
Application Number:
JP2011149509A
Publication Date:
July 10, 2013
Filing Date:
July 05, 2011
Export Citation:
Assignee:
Olympus Endo Technology America Inc.
International Classes:
G02B21/26; G02B7/28; G02B21/36; G03B13/36; G03B17/00; G03B17/14; H04N5/232
Domestic Patent References:
| JP2001296478A | ||||
| JP63167313A | ||||
| JP2118609A | ||||
| JP9189849A | ||||
| JP2001083391A | ||||
| JP2001091821A | ||||
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