Title:
走査プローブ顕微鏡によりピエゾ電気応答を測定する方法
Document Type and Number:
Japanese Patent JP5307244
Kind Code:
B2
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Inventors:
Lichen, Jörg
Application Number:
JP2011524153A
Publication Date:
October 02, 2013
Filing Date:
August 27, 2008
Export Citation:
Assignee:
SPECS ZURICH GMBH
International Classes:
G01Q60/32
Domestic Patent References:
| JP6258072A | ||||
| JP2007155423A | ||||
| JP2005241525A |
Foreign References:
| WO2008071013A1 | ||||
| WO2008006229A1 |
Other References:
XINQI CHEN,STRUCTURES AND LOCAL POLARIZED DOMAINS OF FERROELECTRIC ORGANIC FILMS STUDIED BY ATOMIC FORCE MICROSCOPY,JAPANESE JOURNAL OF APPLIED PHYSICS, PART 1,JAPANESE JOURNAL APPL. PHYS JAPAN,1998年 6月,V37 N6B,P3834-3837,BY ATOMIC FORCE MICROSCOPY
Attorney, Agent or Firm:
Kurata Masatoshi
Satoshi Kono
Makoto Nakamura
Yoshihiro Fukuhara
Takashi Mine
Toshio Shirane
Sadao Muramatsu
Nobuhisa Nogawa
Katsu Sunagawa
Satoshi Kono
Makoto Nakamura
Yoshihiro Fukuhara
Takashi Mine
Toshio Shirane
Sadao Muramatsu
Nobuhisa Nogawa
Katsu Sunagawa