Title:
自由落下検出方法及び自由落下検出装置
Document Type and Number:
Japanese Patent JP5329240
Kind Code:
B2
Abstract:
A method of detecting a free fall of a device includes measuring an acceleration of the device, calculating an integral of the acceleration, and determining whether the acceleration is periodic. If the acceleration is not periodic, the integral of the acceleration is compared with a first critical value to determine whether the device falls freely. If the acceleration is periodic, the integral of the acceleration is compared with a second critical value to determine whether the device falls freely. The first and second critical values are different. Since whether the device is periodically accelerated is considered, free fall of the device can be correctly detected, and thus malfunction of the device can be prevented. For example, an unnecessary protection operation for a hard disk drive of the device can be prevented, and thus a user can conveniently use the device.
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Inventors:
Cho Keio
Shen Shun-soo
Shen Shun-soo
Application Number:
JP2009000369A
Publication Date:
October 30, 2013
Filing Date:
January 05, 2009
Export Citation:
Assignee:
Samsung Electronics Co.,Ltd.
International Classes:
G01P15/00
Domestic Patent References:
JP2000298136A | ||||
JP8221886A | ||||
JP2007257808A | ||||
JP2006300790A |
Foreign References:
WO2006061950A1 |
Attorney, Agent or Firm:
IPD International Patent Business Corporation
Miaki Kametani
Tetsuo Kanamoto
Miaki Kametani
Tetsuo Kanamoto