Title:
局所的なテスト設備とのワイアレスインターフェースを有する遠隔テスト設備
Document Type and Number:
Japanese Patent JP5355894
Kind Code:
B2
Abstract:
A central test facility transmits wirelessly test data to a local test facility, which tests electronic devices using the test data. The local test facility transmits wirelessly response data generated by the electronic devices back to the central test facility, which analyzes the response data to determine which electronic devices passed the testing. The central test facility may provide the results of the testing to other entities, such as a design facility where the electronic devices were designed or a manufacturing facility where the electronic devices where manufactured. The central test facility may accept requests for test resources from any of a number of local test facilities, schedule test times corresponding to each test request, and at a scheduled test time, wirelessly transmits test data to a corresponding local test facility.
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Inventors:
Candros, Igor Wai.
Eldridge, Benjamin N.
Eldridge, Benjamin N.
Application Number:
JP2007546938A
Publication Date:
November 27, 2013
Filing Date:
December 15, 2005
Export Citation:
Assignee:
Form Factor, Incorporated
International Classes:
G01R31/28; H01L21/66
Domestic Patent References:
| JP2003100825A | ||||
| JP10173021A | ||||
| JP2004158820A |
Foreign References:
| WO2004088339A1 |
Attorney, Agent or Firm:
Yoshiyuki Inaba
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