Title:
試料分析方法、試料搬入部材、試料搬入方法および昇温脱離分析装置
Document Type and Number:
Japanese Patent JP5405218
Kind Code:
B2
Inventors:
Kunimitsu Maejima
Kenichi Takai
Norio Hirashita
Kenichi Takai
Norio Hirashita
Application Number:
JP2009162087A
Publication Date:
February 05, 2014
Filing Date:
July 08, 2009
Export Citation:
Assignee:
Electronic Science Co., Ltd.
International Classes:
G01N1/00
Domestic Patent References:
| JP54118164A | ||||
| JP9059001A | ||||
| JP7306182A | ||||
| JP54051370A | ||||
| JP2000260750A | ||||
| JP2000028580A | ||||
| JP2008268100A |
Attorney, Agent or Firm:
Kamei Takeyuki