Title:
精密フェーズシフト発生装置と精密長さ測定システム
Document Type and Number:
Japanese Patent JP5419060
Kind Code:
B2
More Like This:
Inventors:
Ji Yang Lou
Application Number:
JP2008207132A
Publication Date:
February 19, 2014
Filing Date:
August 11, 2008
Export Citation:
Assignee:
National Institute of Metrology P.R.China
International Classes:
G01B9/02; G01B11/02
Domestic Patent References:
| JP62223603A | ||||
| JP2000162516A | ||||
| JP2004069380A | ||||
| JP2005043099A |
Other References:
Naoki Kuramoto, Kenichi Fujii, Yasushi Azuma, Shigeki Mizushima, Yasutake Toyoshima,"Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning",IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2007年 4月,Vol.56, No.2,pages 476-480
Naoki Kuramoto, Kenichi Fujii,"Interferometric Determination of the Diameter of a Silicon Sphere Using a Direct Optical Frequency Tuning System",IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2003年 4月,Vol.52, No.2,pages 631-635
Naoki Kuramoto, Kenichi Fujii,"Volume Determination of a Silicon Sphere Using an Improved Interferometer With Optical Frequency Tuning",IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2005年 4月,Vol.54, No.2,pages 868-871
Naoki Kuramoto, Kenichi Fujii,"Interferometric Determination of the Diameter of a Silicon Sphere Using a Direct Optical Frequency Tuning System",IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2003年 4月,Vol.52, No.2,pages 631-635
Naoki Kuramoto, Kenichi Fujii,"Volume Determination of a Silicon Sphere Using an Improved Interferometer With Optical Frequency Tuning",IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2005年 4月,Vol.54, No.2,pages 868-871
Attorney, Agent or Firm:
Yoshimi Saigo