Title:
試験装置
Document Type and Number:
Japanese Patent JP5501136
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a testing apparatus capable of, under a plurality of measurement conditions, easily and promptly setting a confirmation threshold value to be compared with a measurement value in order to detect any abnormality in an electrification body such as a test probe.SOLUTION: A leak current testing apparatus 1 includes: a flash ROM 4 for storing a plurality of inspection allowances corresponding to a plurality of measurement conditions; a power supply cable 101 corresponding to each of the measurement conditions; a leak current measuring section 8 for measuring an electrical measurement value via test probes T1-T3; calculation means for uniformly calculating a plurality of confirmation threshold values by multiplying each of the plurality of inspection allowances by a predetermined conversion rate; and determination means for comparing the inspection allowances corresponding to the plurality of measurement conditions with the measurement value to determine the propriety of that measurement value, and further comparing the confirmation threshold values corresponding to the measurement conditions with the measurement value for a part of or all of the plurality of measurement conditions, to determine the propriety of that measurement value.
Inventors:
Konosu Kenichi
Application Number:
JP2010167059A
Publication Date:
May 21, 2014
Filing Date:
July 26, 2010
Export Citation:
Assignee:
Hioki Electric Co., Ltd.
International Classes:
G01R31/00; G01R31/02; G01R31/18
Domestic Patent References:
| JP2004226179A | ||||
| JP2004138565A | ||||
| JP2010071963A |
Attorney, Agent or Firm:
Yoshio Komiya
Hiroyuki Onishi
Hiroyuki Onishi