Title:
検査実施支援プログラム、検査実施支援装置、検査実施支援システム、及び検査実施支援方法
Document Type and Number:
Japanese Patent JP5573283
Kind Code:
B2
Inventors:
Haruhiko Hino
Application Number:
JP2010071749A
Publication Date:
August 20, 2014
Filing Date:
March 26, 2010
Export Citation:
Assignee:
FUJITSU, LTD.
International Classes:
G06Q50/22
Attorney, Agent or Firm:
Shuhei Katayama