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Title:
半導体集積回路の動作の制御方法及び半導体集積回路の制御システム
Document Type and Number:
Japanese Patent JP5682647
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a control method for a semiconductor integrated circuit capable of designing a semiconductor integrated circuit in a short time.SOLUTION: A control method for operation of a semiconductor integrated circuit includes respective steps of supplying, to a control system, the information about circuit characteristics corresponding to variation in process of a semiconductor integrated circuit and operating, by the control system, the semiconductor integrated circuit at a temperature and with a power source voltage corresponding to the information. The semiconductor integrated circuit is designed by determining variable tolerable range about operation temperature and operation power source voltage at the time of operation of the semiconductor integrated circuit, calculating, for each circuit characteristic corresponding to the process variation of the semiconductor integrated circuit, a target temperature and a target power source voltage which cancel fluctuation of circuit characteristic that is caused by the process variation, and designing a circuit so that correct operation is made at an arbitrary temperature and power source voltage within the tolerable range, with the assumption that the semiconductor integrated circuit operates within the tolerable range around the target temperature and the target power source voltage.

Inventors:
小川 敏男
Application Number:
JP2013061894A
Publication Date:
March 11, 2015
Filing Date:
March 25, 2013
Export Citation:
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Assignee:
富士通セミコンダクター株式会社
International Classes:
H01L21/82; G06F17/50; H01L21/822; H01L27/04
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Yamaguchi Akinori