Title:
Ｘ線透視撮影装置
Document Type and Number:
Japanese Patent JP5716643
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an X-ray fluoroscopic apparatus capable of easily and safely changing an angle position of an X-ray detector though with a compact configuration.SOLUTION: In the state where a support tray 22 is arranged at a detection position for detecting X-rays by a flat panel detector, a distal end of a pin in a pin mechanism 30 and a recess 36 of a guide cam 35 are engaged. In the state, at a position facing the rear end of the pin, a facing surface 39 in a stopper 38 is closely arranged. Thus, even when a rotary 23 is to rotate together with the guide cam 35, the distal end of the pin cannot get on an outer circumferential surface from the recess 36 of the guide cam 35 since the facing surface 39 of the stopper 38 is arranged closely to the rear end of the pin. Thus, when the support tray 22 is arranged at the detection position, the rotation of the rotary tray 23 is limited.
Inventors:
Wataru Miyamoto
Yoshiaki Tanaka
Hamanaka Uiri
Yoshiaki Tanaka
Hamanaka Uiri
Application Number:
JP2011255735A
Publication Date:
May 13, 2015
Filing Date:
November 24, 2011
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
A61B6/00
Domestic Patent References:
| JP2002530176A | ||||
| JP2005211226A | ||||
| JP2012065882A |
Foreign References:
| WO2001033921A1 |
Attorney, Agent or Firm:
Takashi Otsubo