Title:
試料を光熱分析するための分析装置及び分析方法
Document Type and Number:
Japanese Patent JP5833603
Kind Code:
B2
Abstract:
The device (10) comprises an excitation source (14,20,22) for generating an electromagnetic excitation beam directed onto an excitation side of a sample (12), and a detector (28) for detecting thermal radiation (26) emitted by a detection side of the sample. A temperature controllable sample chamber (36) with a sample holder (13) is provided for the arrangement and temperature control of the sample. An adjustable detection lens is provided between the sample holder and the detector, which is adjustable for adjusting a field of vision of the detector on the sample surface. An independent claim is included for a method for photothermal investigation of a sample.
Inventors:
Martin Bruner
Jurgen Bloom
Thomas Denner
Robert Campbell
Tiro Hilpert
Michael Gebhar
Stefan Roterbach
Andrea Strobel
Jürgen Chepel
Matthias Shader
Andre Lindemann
Andreas Haltinger
Jurgen Bloom
Thomas Denner
Robert Campbell
Tiro Hilpert
Michael Gebhar
Stefan Roterbach
Andrea Strobel
Jürgen Chepel
Matthias Shader
Andre Lindemann
Andreas Haltinger
Application Number:
JP2013158026A
Publication Date:
December 16, 2015
Filing Date:
July 30, 2013
Export Citation:
Assignee:
Netti Guerete Bau Game Behr
International Classes:
G01N25/18
Domestic Patent References:
| JP2001507126A | ||||
| JP63206644A | ||||
| JP2009139163A | ||||
| JP63292046A | ||||
| JP2006317279A | ||||
| JP2006220600A | ||||
| JP2008157802A | ||||
| JP11094781A | ||||
| JP2011145138A | ||||
| JP63058242A | ||||
| JP2009526983A | ||||
| JP2003194752A | ||||
| JP10142177A | ||||
| JP2009068952A |
Attorney, Agent or Firm:
Kenji Sugimura
Yoshihiro Uemura
Yamato Okano
Yoshihiro Uemura
Yamato Okano