三次元計測装置、三次元計測方法およびプログラム

Title:

三次元計測装置、三次元計測方法およびプログラム

Document Type and Number:

Japanese Patent JP5864950

Kind Code:

B2

Abstract:

A three-dimensional measurement apparatus includes a detection unit configured to detect, in an image captured by a capture unit, position information of a pattern on a capture pixel surface, which is projected to a plurality of pattern detection areas preset on the same plane in a measurement space, and a corresponding relationship calculation unit configured to calculate, using the position information, a corresponding relationship between the pattern on a projection pixel surface of a projection unit detected in advance before measurement and the pattern on the projection pixel surface of the projection unit at the time of measurement.

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Inventors:

▲高▼林志幾

Application Number:

JP2011177744A

Publication Date:

February 17, 2016

Filing Date:

August 15, 2011

Export Citation:

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Assignee:

Canon Inc

International Classes:

G01B11/25; G06T1/00

Domestic Patent References:

JP2008170280A
JP2006292409A
JP854234A
JP5248830A

Foreign References:

WO2010000818A2
WO2006120759A1

Attorney, Agent or Firm:

Yasunori Otsuka
Shiro Takayanagi
Yasuhiro Otsuka
Shuji Kimura
Osamu Shimoyama
Nagakawa Yukimitsu

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