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Title:
超解像パラメータ判定装置、画像縮小装置、及びプログラム
Document Type and Number:
Japanese Patent JP5866245
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To determine the optimal parameter among super-resolution parameters to be used for the generation of a super-resolution image with high accuracy.SOLUTION: A super-resolution parameter determination device 1 includes: a time and space frequency analysis part 11 for performing the frequency resolution of an original image in a time direction and a space direction to generate the resolution image of each frequency band; an each-band isolated point element detection part 12 for detecting an isolated point element in the resolution image for each frequency band; an each-band noise element information generation part 13 for determining an isolated point element whose value exceeds a predetermined noise threshold as a noise element for each frequency band; and an optimal super-resolution parameter detection part 14 for determining pixels having the noise elements across at least the predetermined number of frequency bands as the noise pixels of the original image, for calculating the index of a difference between the original image and the super-resolution image by excluding the noise elements, and for determining the super-resolution parameter used for the generation of the super-resolution image when the index of the difference is the minimum as an optimal super-resolution parameter.

Inventors:
Yasutaka Matsuo
Toshie Misu
Shinichi Sakaida
Application Number:
JP2012095553A
Publication Date:
February 17, 2016
Filing Date:
April 19, 2012
Export Citation:
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Assignee:
Japan Broadcasting Corporation
International Classes:
G06T3/00; H04N7/01
Domestic Patent References:
JP2011228974A
JP2010045711A
JP2010041337A
Attorney, Agent or Firm:
Kenji Sugimura
Makoto Fukuo