Title:
リソグラフィ装置およびリソグラフィ方法
Document Type and Number:
Japanese Patent JP5886279
Kind Code:
B2
Abstract:
A lithographic apparatus includes a radiation source configured to produce a radiation beam. The lithographic apparatus also includes a support configured to support a patterning device. The patterning device is configured to impart the radiation beam with a pattern to form a patterned radiation beam. The support is provided with a pellicle which comprises a layer of graphene.
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Inventors:
Andrey Yakunin
Banier, Badim
Lurop stra, eric
Van der Schoat, Helmen
Stevens, Lucas
Ban Kampen, Marten
Banier, Badim
Lurop stra, eric
Van der Schoat, Helmen
Stevens, Lucas
Ban Kampen, Marten
Application Number:
JP2013515778A
Publication Date:
March 16, 2016
Filing Date:
March 17, 2011
Export Citation:
Assignee:
AS M Netherlands B.V.
International Classes:
G03F7/20; G03F1/24; G03F1/62; H05G2/00
Domestic Patent References:
JP8321395A | ||||
JP11051576A | ||||
JP2000349009A | ||||
JP2004327213A | ||||
JP2007531296A | ||||
JP2009004647A |
Attorney, Agent or Firm:
Yoshiyuki Inaba
Toshifumi Onuki
Toshifumi Onuki