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Title:
電子部品
Document Type and Number:
Japanese Patent JP5929540
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an electronic component in which measurement deficiency is less caused by deterioration of contact between a probe and a measurement electrode.SOLUTION: An electronic component 100 includes an electronic component element 10, a plurality of mount electrodes 13 mounted on a surface of the electronic component element 10, and a measurement electrode 16 electrically connected to at least one of the mount electrodes 13. The surface of the measurement electrode 16 is harder than the surface of the mount electrode 13.

Inventors:
Soto Shimodo
Masanobu Nomura
Application Number:
JP2012137604A
Publication Date:
June 08, 2016
Filing Date:
June 19, 2012
Export Citation:
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Assignee:
MURATA MANUFACTURING CO.,LTD.
International Classes:
H01G4/33; H01G4/12
Domestic Patent References:
JP2001210642A
JP2002090422A
JP2125409A
Attorney, Agent or Firm:
Fukami patent office



 
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