Title:
微細電極回路検査用ピンの製造方法及びこの方法で製造された微細電極回路検査用ピン
Document Type and Number:
Japanese Patent JP6376541
Kind Code:
B2
Inventors:
Gufansop
Lee Kyuhan
John Byung Jun
Van hossop
John Hisshock
Gin Hyunze
Lee Kyuhan
John Byung Jun
Van hossop
John Hisshock
Gin Hyunze
Application Number:
JP2016531510A
Publication Date:
August 22, 2018
Filing Date:
July 07, 2014
Export Citation:
Assignee:
With Memes Company Limited
International Classes:
G01R1/067; H01R13/24; H01R43/00
Domestic Patent References:
| JP2010188516A | ||||
| JP2010026147A |
Foreign References:
| US20100207654 |
Attorney, Agent or Firm:
Shinji Aida
Zheng Yuanji
Kyoko Aida
Zheng Yuanji
Kyoko Aida