Title:
分析データ処理方法及び装置
Document Type and Number:
Japanese Patent JP6465121
Kind Code:
B2
Abstract:
When conducting imaging mass analysis for a region to be measured on a sample, an individual reference value calculating part (21) obtains a maximum value in Pi/Ii (where Pi is a TIC value, Ii is a maximum intensity value) of respective measuring points, and stores the value in an external memory device (3) together with measured data as an individual reference value. When performing comparison analysis for a plurality of the data obtained from different samples, a common reference value determining part (22) reads out corresponding a plurality of the individual reference values and determines a minimum value as a common reference value Fmin. A normalization calculation processing part (23) normalizes the respective intensity values by multiplying the intensity values read out from the external memory device (3) by a normalization coefficient long_Max x (Fmin/Pi) obtained from the common reference value Fmin, TIC values Pi at the respective measuring points, and a maximum allowable value long_Max of a variable storing the intensity values at the time of operation. Accordingly, normalization of the intensity values between a plurality of mass analysis imaging data may be performed easily, and the round-off errors may be minimized while avoiding overflow at the time of operation.
Inventors:
Masahiro Ikegami
Kajiwara Shigeki
Kajiwara Shigeki
Application Number:
JP2016565611A
Publication Date:
February 06, 2019
Filing Date:
December 22, 2014
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
G01N27/62
Domestic Patent References:
| JP2014215043A |
Foreign References:
| WO2014175211A1 |
Attorney, Agent or Firm:
Kyoto International Patent Office