Title:
粒子の検出
Document Type and Number:
Japanese Patent JP6517297
Kind Code:
B2
Abstract:
A particle detection system (600) including; at least one light source (606) adapted to illuminate a volume being monitored (610) at at least two wavelengths; a receiver (604) having a field of view (620) and being adapted to receive light from at least one light source (606, 607) after said light has traversed the volume being monitored and being adapted to generate signals indicative of the intensity of light received at regions within the field of view of the receiver; a processor (624) associated with the receiver (604) adapted to process the signals generated by the receiver to correlate light received at at least two wavelengths in corresponding regions within the field of view of the receiver and generate an output indicative of the relative level of light received at the two wavelengths.
Inventors:
Ron Knox
Kemal Ajay
Karl Botger
Kemal Ajay
Karl Botger
Application Number:
JP2017192640A
Publication Date:
May 22, 2019
Filing Date:
October 02, 2017
Export Citation:
Assignee:
GARRETT THERMAL SYSTEMS LIMITED
International Classes:
G01N21/59; G08B17/103
Domestic Patent References:
| JP2006085608A | ||||
| JP6082358A | ||||
| JP63246638A | ||||
| JP57128831A | ||||
| JP4148493A | ||||
| JP2007179266A | ||||
| JP51127786A | ||||
| JP2001116692A | ||||
| JP3188596A |
Foreign References:
| US20020153499 |
Attorney, Agent or Firm:
Takuji Yamada
Haruo Nakano
Haruo Nakano