Title:
欠陥検査装置、方法およびプログラム
Document Type and Number:
Japanese Patent JP6556266
Kind Code:
B2
Abstract:
There are provided a defect inspection apparatus, method, and program for, in a case of using an image of an inspection-target industrial product (test object) to conduct an inspection to check whether defects are present, allowing an image interpreter to precisely and efficiently detect defects. A possible-defect image D3 indicating a crack-like defect and a simulation result image P3 indicating the predicted growth of the crack-like defect are displayed. Sliders L1 and L2 and checkboxes CB1 are used to enable selection of possible defects and simulation results to be displayed. An image interpreter can use the checkboxes CB1 to select a type of possible defect to be displayed, and can use the sliders L1 and L2 to select possible defects to be displayed on the basis of the wall thickness of portions in which possible defects are detected and the size of possible defects.
Inventors:
Yasuhiko Kaneko
Application Number:
JP2017563716A
Publication Date:
August 07, 2019
Filing Date:
November 25, 2016
Export Citation:
Assignee:
FUJIFILM Corporation
International Classes:
G01N21/88; G01N23/18; G01N23/203
Domestic Patent References:
| JP844421A | ||||
| JP2011232111A | ||||
| JP11110036A | ||||
| JP2014182113A | ||||
| JP200724835A | ||||
| JP2001156135A | ||||
| JP6180281A |
Attorney, Agent or Firm:
Kenzo Matsuura