Title:
検査装置
Document Type and Number:
Japanese Patent JP6568733
Kind Code:
B2
Abstract:
The invention provides an inspection device, which is used to improve measuring precision of an electric characteristic of an element. The inspection device comprises a holding bench (32), a pair of measuring members (37) used for holding the element (s) disposed on the holding bench (32) for measuring the electric characteristic, and a grounding wire (132) connected with a surface (29f) of a main body (29). The holding bench (32) is in a state of being conducted with the main body (29) at an initial position, and then is grounded by the grounding wire (132). At the initial position, the element (s) disposed on the holding bench (32) is de-energized reliably and quickly, and the measuring precision of the electric characteristic of the element (s) is improved.
Inventors:
Toshiyuki Sawada
Application Number:
JP2015141585A
Publication Date:
August 28, 2019
Filing Date:
July 15, 2015
Export Citation:
Assignee:
Fuji corporation
International Classes:
H05K13/00; G01R31/00
Domestic Patent References:
JP1076100U | ||||
JP52030703B2 | ||||
JP8186153A | ||||
JP2011009315A |
Foreign References:
WO2014155657A1 | ||||
US5284413 |
Attorney, Agent or Firm:
Chubu International Patent Office
Yuki Kataoka
Yuki Kataoka