Title:
試験システム
Document Type and Number:
Japanese Patent JP6587478
Kind Code:
B2
Inventors:
Shunsuke Nakajima
Takashi Numazawa
Takeshi Ueno
Takashi Numazawa
Takeshi Ueno
Application Number:
JP2015183570A
Publication Date:
October 09, 2019
Filing Date:
September 17, 2015
Export Citation:
Assignee:
Nittan Co., Ltd.
International Classes:
G08B17/00; G08B29/00
Domestic Patent References:
JP6266987A | ||||
JP2000259974A | ||||
JP2004126880A | ||||
JP2014071657A | ||||
JP2005122489A | ||||
JP2014016678A | ||||
JP2007087060A |
Foreign References:
KR100750513B1 |
Attorney, Agent or Firm:
Hiroshi Arafune
Yoshio Arafune
Yoshio Arafune