Title:
検査接触装置
Document Type and Number:
Japanese Patent JP6619014
Kind Code:
B2
Abstract:
The present invention relates to a contact inspection device comprising: a first guide plate having a first probe hole formed therein; a second guide plate which is positioned parallel to the first guide plate and has a second probe hole formed therein; an intermediate plate which is positioned between the first guide plate and the second guide plate and has an intermediate hole formed therein; and a probe which is inserted into the first probe hole, the second probe hole and the intermediate hole, wherein the intermediate plate is relatively moveable with respect to the first guide plate and the second guide plate, the probe is bent in at least a portion thereof, and the bent portion contacts a wall surface of the intermediate hole. The contact inspection device according to the present invention has the effects of being capable of effectively preventing short circuits between narrow pitch probes without forming an insulating covering on the probes, and easily replacing probes without disassembling the contact inspection device.
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Inventors:
Kim, il
Application Number:
JP2017540958A
Publication Date:
December 11, 2019
Filing Date:
December 24, 2015
Export Citation:
Assignee:
Kim, il
International Classes:
G01R1/073; G01R31/26; G01R31/28
Domestic Patent References:
| JP2012054207A | ||||
| JP61004971A | ||||
| JP2005055368A | ||||
| JP4502834A | ||||
| JP2002202337A | ||||
| JP2007212458A | ||||
| JP10096747A | ||||
| JP2010281583A |
Foreign References:
| US4963822 |
Attorney, Agent or Firm:
Atsushi Nakajima
Kato Kazunori
Kato Kazunori