Title:
単純な光学系、より具体的には様々な瞳位置を有する光スキャン顕微鏡
Document Type and Number:
Japanese Patent JP6671296
Kind Code:
B2
Abstract:
A light-scanning microscope including a scan optics for generating a pupil plane conjugate to the pupil plane of the microscope objective, and a variably adjustable beam deflection unit in the conjugate pupil plane. An intermediate image lies between the microscope objective and the scan optics. The scan optics image a second intermediate image (Zb2) into the first intermediate image via the beam deflection unit, wherein the second intermediate image is spatially curved. The deflection unit is not arranged in a collimated section of the beam path, but is instead arranged in a convergent section. Then, in terms of the optical properties and quality thereof, the scan optics needs rather to correspond merely to an eyepiece instead of a conventional scanner objective.
Inventors:
Waldo, Mathias
Beemé, Beate
Sweatshirt, daniel
Anft, Tiemo
Beemé, Beate
Sweatshirt, daniel
Anft, Tiemo
Application Number:
JP2016562755A
Publication Date:
March 25, 2020
Filing Date:
April 16, 2015
Export Citation:
Assignee:
Carl Zeiss AG
International Classes:
G02B21/00
Domestic Patent References:
| JP2008529082A | ||||
| JP2005337730A | ||||
| JP3134606A | ||||
| JP2000187177A | ||||
| JP2006079000A |
Foreign References:
| EP2136231A1 |
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Shinsuke Onuki
Tadahiko Ito
Shinsuke Onuki